Ion beams in nanoscience and technology

Other Authors: Hellborg,, Whitlow,, Zhang,
Format: Book
Language:English
Published: New York: Springer, 2009.
Edition:1st ed.
Series:Particle acceleration and detection
Subjects:
LEADER 00820pamaa2200241 4500
001 0000046576
005 20140919090000.0
008 100121 eng
020 0 0 |a 9783642006227  
090 0 0 |a QC702.7.B65   |b ION 2009 
245 1 0 |a Ion beams in nanoscience and technology   |c edited by Ragnar Hellborg, Harry J. Whitlow, Yanweng Zhang. 
250 0 0 |a 1st ed. 
260 0 0 |a New York:   |b Springer,   |c 2009. 
300 |a xvii, 457p:   |b ill.;   |c 24 cm. 
440 0 0 |a Particle acceleration and detection 
501 0 0 |a CPR 
504 0 0 |a Includes bibliographical references and index 
650 0 0 |a Focused ion beams  
650 0 0 |a Focused ion beams --   |x Industrial applications  
700 1 1 |a Hellborg,   |h Ragnar  
700 1 1 |a Whitlow,   |h Harry J.  
700 1 1 |a Zhang,   |h Yanweng  
901 |u http://www.springeonline.com