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| LEADER |
00669pamaa2200217 4500 |
| 001 |
0000044150 |
| 005 |
20121212090000.0 |
| 008 |
080905 eng |
| 020 |
0 |
0 |
|a 9780471739067
|
| 090 |
0 |
0 |
|a TK7871.85
|b SCH 2006
|
| 100 |
1 |
0 |
|a Schroder
|
| 245 |
1 |
0 |
|a Semiconductor material and device characterization
|c Dieter K. Schroder.
|
| 250 |
0 |
0 |
|a 3rd ed.
|
| 260 |
0 |
0 |
|a New Jersey:
|b John Wiley & Sons,
|c 2006.
|
| 300 |
|
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|a xv, 779p:
|b ill.;
|c 25 cm.
|
| 501 |
0 |
0 |
|a FOEAT
|
| 504 |
0 |
0 |
|a Includes bibliographical references and index
|
| 650 |
0 |
0 |
|a Semiconductors
|
| 650 |
0 |
0 |
|a Semiconductors --
|x Testing
|
| 700 |
1 |
1 |
|a Beckman,
|h William A.
|
| 901 |
|
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|u www.wiley.com
|
