Schroder, & Beckman. (2006). Semiconductor material and device characterization (3rd ed.). New Jersey: John Wiley & Sons.
Chicago Style CitationSchroder, and Beckman. Semiconductor Material and Device Characterization. 3rd ed. New Jersey: John Wiley & Sons, 2006.
MLA CitationSchroder, and Beckman. Semiconductor Material and Device Characterization. 3rd ed. New Jersey: John Wiley & Sons, 2006.
Warning: These citations may not always be 100% accurate.