rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Digital circuit testing and testability
  name:
    name part: LALA
    role:
      role term: creator
  type of resource: text
  origin info:
    place:
      place term: San Diego
    publisher: Academic Press
    date issued: 1997
    issuance: monographic
  physical description:
    extent: xii, 199p.: 24cm.
  note: Parag K. Lala.
  subject:
    topic: Integrated circuits --
    topic: Very large scale integration --
    topic: Testing
  subject:
    topic: Digital integrated circuits --
    topic: Testing
  subject:
    topic: Integrated circuits --
    topic: Fault tolerance
  classification: 621.395 LAL 1997
  identifier: 0124343309
  record info:
    record change date: 20060614090000.0
    record identifier: 0000008368