00561pamaa2200169 4500 0000008368 20060614090000.0 0124343309 621.395 LAL 1997 TK7874.75 LAL 1997 LALA Digital circuit testing and testability Parag K. Lala. San Diego: Academic Press, 1997. xii, 199p.: 24cm. Integrated circuits -- Very large scale integration -- Testing Digital integrated circuits -- Testing Integrated circuits -- Fault tolerance