Digital circuit testing and testability
| Main Author: | |
|---|---|
| Format: | Book |
| Published: |
San Diego:
Academic Press,
1997.
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| Subjects: |
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| 020 | 0 | 0 | |a 0124343309 |
| 082 | |a 621.395 LAL 1997 | ||
| 090 | 0 | 0 | |a TK7874.75 |b LAL 1997 |
| 100 | 1 | 0 | |a LALA |
| 245 | 1 | 0 | |a Digital circuit testing and testability |c Parag K. Lala. |
| 260 | 0 | 0 | |a San Diego: |b Academic Press, |c 1997. |
| 300 | |a xii, 199p.: |b 24cm. | ||
| 650 | 0 | 0 | |a Integrated circuits -- |x Very large scale integration -- |x Testing |
| 650 | 0 | 0 | |a Digital integrated circuits -- |x Testing |
| 650 | 0 | 0 | |a Integrated circuits -- |x Fault tolerance |